Hahn & Kolb

1 0 6 5 FOR MORE DETAI LS OR PRODUCTS , PLEASE VI S I T OUR ONL INE SHOP WWW.HAHN-KOLB.COM Shape, contour and roughness measurements \ Roughness measuring instruments Ident. No. 110 Ident. No. 100 DIAVITE Compact II roughness measuring device mobile roughness measuring device with external feed unit Application: Compact, mobile roughness measuring device for standard roughness measurements in production facilities and measuring rooms. Execution: Roughness parameters in line with DIN ISO, JIS, ASME Standard probe SH with diamond probe tip 5 µm Ident. No. 100: Stylus instrument with feed unit VH for skid-type probe Ident. No. 110: Stylus instrument with feed unit VHF for skid-type probes and free tracers Advantage: Simple and intuitive operation, no training required Safe measurement using permanently connected cut-off filter with scanning path Feed unit can be integrated into device for wireless measuring Measurements in all directions, horizontal, vertical and overhead Delivery: Display device with feed unit, standard sensor SH 5 μm/90°, adapter and connection cable for feed unit, power supply/charger, CD with DIASOFT Basic software, USB connection cable for PC, roughness standard approx. Ra 3 µm, case Technical data: Surface roughness measuring range: 350 µm | 20 µm Min. scanning path: 0.5 mm Max. scanning length: 15 mm Surface roughness resolution: 0.001 µm | 0.01 µm Threshold wave length: 0.25 mm | 0.8 mm | 2.5 mm Measurement profile memory (number of profiles): 15 PCS Data transmission type: USB Model Probe system 47000... DIAVITE Compact II VH Runner probe system Ident. No. 100 ● 47000... DIAVITE Compact II VHF Runner probe system | Free probe system Ident. No. 110 ● Prod. Gr. 445 MarSurf PS 10 roughness measuring device Mobile roughness measuring device with removable feed unit Application: compact, mobile roughness measuring device for standard roughness measurements in production facilities and measuring rooms. Execution: stylus instrument with feed unit for skid-type probe calibration standard integrated in feed unit Roughness parameters in line with DIN ISO, JIS and ASME inductive skid button with 2 µm diamond stylus tip Advantage: simple and intuitive operation, no training required reliable measurement using automatic cut-off selection (patented) Measurements in all directions: horizontal, vertical and overhead Technical data: Surface roughness measuring range: 350 µm Surface roughness scanning path: 1,5 mm | 4,8 mm | 15 mm Threshold wave length: 0.25 mm | 0.8 mm | 2.5 mm Measurement profile memory (number of single readings): 500000 PCS Measurement profile memory (number of profiles): 3900 PCS Data transmission type: MarConnect MarSurf PS 10 roughness measuring device 47100... Ident. No. 020 ● Measuring stand for roughness measuring devices 47100... Measuring stand ST-D Ident. No. Price/unit, € 600 ○ Measuring stand mount 47100... measuring stand holder for ST tripods Ident. No. 670 ○ Software 47100... Software EXPLORER Ident. No. Price/unit, € 680 ○ Prod. Gr. 307