Hahn & Kolb

1 0 6 6 ● = ON STOCK AT HEADQUARTERS ○ = NO STOCK I TEM Shape, contour and roughness measurements \ Roughness measuring instruments Model Probe system 47100... Roughness measuring device MAHR M 300 C MarSurf M 300 C Runner probe system Ident. No. 200 ○ Prod. Gr. 307 MarSurf M 300C roughness measuring device Mobile roughness measuring device with external feed unit for skid-type probe Application: Mobile roughness measuring device for standard roughness measurements in production facilities and measuring rooms. Execution: Stylus instrument with feed unit for skid-type probes Calibration standard integrated into feed unit Roughness parameters in line with DIN ISO, JIS, ASME and MOTIF Standard tracer PHT 6-350 with diamond probe tip 2 µm Thermal printer with high print quality Advantage: Bluetooth connection for wireless data transfer between feed unit and evaluation unit Simple calibration using integrated calibration standard Measurements in all directions, horizontal, vertical and overhead Lock and/or password-protected device settings Up to 5 selectable individual measurement lengths Technical data: Surface roughness measuring range: 350 µm | 180 µm | 90 µm Surface roughness scanning path: 1.75 mm | 5.6 mm | 17.5 mm Surface roughness resolution: 0.032 µm | 0.016 µm | 0.008 µm Threshold wave length: 0.25 mm | 0.8 mm | 2.5 mm Measurement profile memory (number of single readings): 40000 PCS Measurement profile memory (number of profiles): 30 PCS Data transmission type: RS232C/USB Model Probe system 44805... DIAVITE DH-8 VH Runner probe system Ident. No. 706 ● 44805... DIAVITE DH-8 VHF Runner probe system | Free probe system Ident. No. 716 ○ Prod. Gr. 445 Ident. No. 706 DIAVITE DH-8 roughness measuring device With external feed unit: VH for skid-type probes or VHF for skid-type and free tracers Application: Compact, mobile roughness measuring device for standard roughness measurements in production facilities and measuring rooms. Execution: External calibration standard Ra 3.0 µm Roughness parameters in line with DIN ISO, JIS, ASME Standard probe SH with diamond probe tip 5 µm Thermal printer with high print quality Ident. No. 706: Stylus instrument with feed unit VH for skid-type probe Ident. No. 716: Stylus instrument with feed unit VHF for skid-type probes and free tracers Advantage: Total of seven scanners can be calibrated Freely-selectable scanning path and cut-off filter Large measured value memory for 50 measure- ment profiles Evaluation software DIASOFT Basic with individual log generation Delivery: Display device with feed unit, standard sensor SH 5 μm/90°, connection cable for feed unit, power supply/charger, CD with DIASOFT Basic software, USB connection cable for PC, roughness standard approx. Ra 3 µm, case Technical data: Surface roughness measuring range: 350 µm | 20 µm Min. scanning path: 0.5 mm Max. scanning length: 15 mm Surface roughness resolution: 0.001 µm | 0.01 µm Threshold wave length: 0.08 mm | 0.25 mm | 0.8 mm | 2.5 mm Measurement profile memory (number of profiles): 50 PCS Data transmission type: USB